Rakesh Vattikonda at Francisco Columbus blog

Rakesh Vattikonda. Model scalability and generality are comprehensively verified with. Rakesh vattikonda's 8 research works with 1,408 citations and 3,052 reads, including: In this paper, we present a unified approach that directly predicts the change of key transistor parameters under various process and design. Sort by citations sort by. View rakesh vattikonda’s profile on linkedin, a professional community of 1 billion members. Rakesh vattikonda received the b.tech. Scalable model for predicting the effect of negative bias. Degree from indian institute of technology, guwahati, india, and the m.tech. In this paper, a predictive model is developed for the degradation of nbti in both static and dynamic operations.

Rakesh Mohan Bakshi
from www.legaleraonline.com

Sort by citations sort by. View rakesh vattikonda’s profile on linkedin, a professional community of 1 billion members. Model scalability and generality are comprehensively verified with. Rakesh vattikonda's 8 research works with 1,408 citations and 3,052 reads, including: Rakesh vattikonda received the b.tech. In this paper, we present a unified approach that directly predicts the change of key transistor parameters under various process and design. Degree from indian institute of technology, guwahati, india, and the m.tech. Scalable model for predicting the effect of negative bias. In this paper, a predictive model is developed for the degradation of nbti in both static and dynamic operations.

Rakesh Mohan Bakshi

Rakesh Vattikonda View rakesh vattikonda’s profile on linkedin, a professional community of 1 billion members. In this paper, a predictive model is developed for the degradation of nbti in both static and dynamic operations. Degree from indian institute of technology, guwahati, india, and the m.tech. Sort by citations sort by. Model scalability and generality are comprehensively verified with. Rakesh vattikonda received the b.tech. Rakesh vattikonda's 8 research works with 1,408 citations and 3,052 reads, including: Scalable model for predicting the effect of negative bias. In this paper, we present a unified approach that directly predicts the change of key transistor parameters under various process and design. View rakesh vattikonda’s profile on linkedin, a professional community of 1 billion members.

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