#include "pm.h"
#include "pic24_all.h"
#include "CuTestSmall.h"
#include "pyFuncsInC.h"
#include <pps.h>
Go to the source code of this file.
Functions | |
void | test_gpioExists (CuTest *tc) |
void | test_gpioOdExists (CuTest *tc) |
void | test_gpioSetPinIsInput (CuTest *tc) |
void | test_gpioGetPinIsInput (CuTest *tc) |
void | test_gpioSetPinIsDigital (CuTest *tc) |
void | test_gpioSetPinIsOpenDrain (CuTest *tc) |
void | test_gpioSetPinPullDirection (CuTest *tc) |
void | test_gpioUnmapPin (CuTest *tc) |
void | test_gpioSetDigitalPin (CuTest *tc) |
void | test_gpioReadDigitalPin (CuTest *tc) |
void | test_gpioReadDigitalLatch (CuTest *tc) |
void | test_configDigitalPin (CuTest *tc) |
void | test_configAnalogPin (CuTest *tc) |
void | test_configPwm (CuTest *tc) |
void | test_setPwm (CuTest *tc) |
CuSuite * | getSuite_testGpio () |
int | main (void) |
Variables | |
pPmNativeFxn_t const | usr_nat_fxn_table [] |
Note that these test routines rely on local versions of CuTest.c and CuTest.h. This is because some of the defines in CuTest.h have been modified to accomodate a limited RAM space (e.g. original max string size was 8K, etc.).
Definition in file unit_main.c.
CuSuite* getSuite_testGpio | ( | ) |
Run a series of tests on general-purpose I/O functions.
Definition at line 491 of file unit_main.c.
void test_configAnalogPin | ( | CuTest * | tc | ) |
A series of tests of configAnalogPin.
tc | Test object. |
Definition at line 418 of file unit_main.c.
void test_configDigitalPin | ( | CuTest * | tc | ) |
A series of tests of configDigitalPin.
tc | Test object. |
Definition at line 397 of file unit_main.c.
void test_configPwm | ( | CuTest * | tc | ) |
A series of tests of configPwm.
tc | Test object. |
Definition at line 436 of file unit_main.c.
void test_gpioExists | ( | CuTest * | tc | ) |
A series of tests on the existance of digital IO pins.
tc | Test object. |
Definition at line 42 of file unit_main.c.
void test_gpioGetPinIsInput | ( | CuTest * | tc | ) |
A series of tests of getPinIsInput.
tc | Test object. |
Definition at line 210 of file unit_main.c.
void test_gpioOdExists | ( | CuTest * | tc | ) |
A series of tests on the existance of digital IO pins. Note: Microchip header files define _ODCA0-4, but the data sheet claims these don't exist. So, the test below fail. For now, ignore this. The same is true of pins on ports B and C.
It looks like the header files defined the ODC bits if the corresponding LATx/Rx bits exist, which is incorrect.
Therefore, these tell will always fail. Aargh.
tc | Test object. |
Definition at line 123 of file unit_main.c.
void test_gpioReadDigitalLatch | ( | CuTest * | tc | ) |
A series of tests of readDigitalPin.
tc | Test object. |
Definition at line 378 of file unit_main.c.
void test_gpioReadDigitalPin | ( | CuTest * | tc | ) |
A series of tests of readDigitalPin.
tc | Test object. |
Definition at line 357 of file unit_main.c.
void test_gpioSetDigitalPin | ( | CuTest * | tc | ) |
A series of tests of setDigitalPin.
tc | Test object. |
Definition at line 340 of file unit_main.c.
void test_gpioSetPinIsDigital | ( | CuTest * | tc | ) |
A series of tests of setPinIsDigital.
tc | Test object. |
Definition at line 232 of file unit_main.c.
void test_gpioSetPinIsInput | ( | CuTest * | tc | ) |
A series of tests of setPinIsInput.
tc | Test object. |
Definition at line 192 of file unit_main.c.
void test_gpioSetPinIsOpenDrain | ( | CuTest * | tc | ) |
A series of tests of setPinIsOpenDrain.
tc | Test object. |
Definition at line 257 of file unit_main.c.
void test_gpioSetPinPullDirection | ( | CuTest * | tc | ) |
A series of tests of setPinPullDirection.
tc | Test object. |
Definition at line 282 of file unit_main.c.
void test_gpioUnmapPin | ( | CuTest * | tc | ) |
A series of tests of unmapPin.
tc | Test object. |
Definition at line 313 of file unit_main.c.
void test_setPwm | ( | CuTest * | tc | ) |
A series of tests of setPwm.
tc | Test object. |
Definition at line 480 of file unit_main.c.